Type
Text
Type
Thesis
Advisor
Venkatesh, T.A. | Koga, Tadanori | Raghothamachar, Balaji.
Date
2013-12-01
Keywords
finite element method, forward analysis, nanoindentation, thin film, transversely isotropic | Materials Science
Department
Department of Materials Science and Engineering.
Language
en_US
Source
This work is sponsored by the Stony Brook University Graduate School in compliance with the requirements for completion of degree.
Identifier
http://hdl.handle.net/11401/76374
Publisher
The Graduate School, Stony Brook University: Stony Brook, NY.
Format
application/pdf
Abstract
Instrument indentation based methods for determining elasto-plastic properties of bulk specimen or thin film have received considerable and continue growing attention for recent decades, due to its simplicity, operability, and potential applications. However, the researches of transversely isotropic thin film are still at the beginning stage. In order to obtain a deeper understand of the relationship between P&ndashh curve and thin film properties, both dimensional analysis method and finite element method were applied in the present work. Extensive computational analysis of 630 sets of materials properties was carried out here. Through systematical studies, a more reasonable and intrinsic relationship, between indenter displacement h and the force P on it, was revealed. Also, an effect of materials transverse isotropic properties was summarized. Moreover, accurate and powerful forward analysis functions were established at the end of this thesis. These functions were, then, tested and mismatches were studied. | 61 pages
Recommended Citation
Zhi, Zheng, "Forward Analysis of Transversely Isotropic Thin Film by Indentation Method" (2013). Stony Brook Theses and Dissertations Collection, 2006-2020 (closed to submissions). 2298.
https://commons.library.stonybrook.edu/stony-brook-theses-and-dissertations-collection/2298